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Dr. Laura Finzi
400 Dowman Dr.
Math and Science Center
Room: N246
Phone: 404-727-4930
Email: lfinzi@emory.edu
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Atomic force microscopy (AFM)

Atomic force microscopy In AFM imaging, specimens are deposited on an atomically flat surface, usually mica, in liquid or ambient pressure gas environments. The surface is then scanned with a sharp tip to acquire its height profile. AFM imaging has been extremely informative in our understanding of many DNA-protein complex interactions by allowing quantification of DNA bending effects and visualization of protein-induced DNA compaction or supercoiling.

The figure above represents AFM instrumentation, principle of operation and image of CI-mediated DNA loop. Scale bar = 100nm

Follow the link to Research/Methods/AFM to see how we improved this technique.

Complete List of Published Work in MyBibliography:

http://www.ncbi.nlm.nih.gov/myncbi/browse/collection/40647244/?sort=date&direction=descending